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A comparison of the properties of porous silicon formed on polished and textured (1 0 0) Si: High resolution XRD and PL studies

✍ Scribed by G. Bhagavannarayana; Shailesh N. Sharma; R.K. Sharma; S.T. Lakshmikumar


Book ID
113781667
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
326 KB
Volume
97
Category
Article
ISSN
0254-0584

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