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A comparison of techniques for obtaining convergent beam electron diffraction patterns with a JEOL 200CX

✍ Scribed by Kevin C. Lee


Book ID
107948973
Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
673 KB
Volume
10
Category
Article
ISSN
0304-3991

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A new method for the ab initio derivation of Buerger-reduced primitive cell parameters from coordinate measurements of spots on single convergent-beam electron diffraction (CBED) patterns is described, which does not involve trial-and-error. The pattern can be taken along any zone axis, and misorien