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A comparison of fission fragment induced ion emission from metallic and dielectric films

✍ Scribed by W. Knippelberg; O. Becker; K. Wien

Book ID
107916438
Publisher
Elsevier Science
Year
1982
Weight
403 KB
Volume
198
Category
Article
ISSN
0167-5087

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## Abstract COο£ΏNH~3~ and COο£ΏNH~3~–H~2~O ices at 25–130 K were bombarded by ^252^Cf fission fragments (∼65 MeV at the target surface) and the emitted secondary ions were analyzed by time‐of‐flight mass spectrometry (TOF‐SIMS). It is observed that the mass spectra obtained from both ices have similar