Application of X-ray computed tomography
โฆ LIBER โฆ
A comparison of film based tomography and computed tomography for advanced ceramic materials: 38817 Ellingson, W.A.; Vannier, M.W.; Kriz, R.J. Argonne National Laboratory, Illinois (United States), CONF-8704231-1, DE88-003114, 21 pp. (Jun. 1987)
- Publisher
- Elsevier Science
- Year
- 1990
- Weight
- 159 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0308-9126
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