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A comparison of analog tomography and computed tomography for nondestructive evaluation of advanced ceramic materials: 39603 Ellingson, W.A.; Vannier, M.W.; Kriz, R.J. Proceedings of the 16th Symposium on Nondestructive Evaluation, San Antonio, Texas (United States), 21–23 Apr. 1987. pp. 252–263. Nondestructive Testing Information Analysis Center, Texas, USA


Publisher
Elsevier Science
Year
1990
Weight
163 KB
Volume
23
Category
Article
ISSN
0308-9126

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