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A comparative study of the polyaniline thin films produced by the cluster beam deposition and laser ablation methods

✍ Scribed by Lim, Hyuna; Choi, Jong-Ho


Book ID
121010542
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
827 KB
Volume
124
Category
Article
ISSN
0021-9606

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Thin films of nasicon structure have been grown from NaM,(PO,), (M = Ti and Zr) targets onto silicon substrates by the laser ablation method. By the complementary use of electron microscopy, Rutherford backscattering spectrometry and X-ray diffraction techniques. the surface morphology of the deposi