✦ LIBER ✦

A comparative study of metal-semiconductor-metal photodetectors on GaAs with indium-tin-oxide and Ti/Au electrodes

✍ Scribed by Seo, J.-W.; Ketterson, A.A.; Ballegeer, D.G.; Cheng, K.-Y.; Adesida, I.; Li, X.; Gessert, T.

Book ID: 119783482
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 339 KB
Volume: 4
Category: Article
ISSN: 1041-1135
DOI: 10.1109/68.149898

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

InGaAsN Metal–Semiconductor–Metal Photod

InGaAsN Metal–Semiconductor–Metal Photodetectors with Transparent Indium Tin Oxide Schottky Contacts

✍ Su, Yan-Kuin; Chen, Wei-Cheng; Chuang, Ricky W.; Hsu, Shuo-Hsien; Chen, Bing-Yan 📂 Article 📅 2007 🏛 Institute of Pure and Applied Physics 🌐 English ⚖ 221 KB

[IEEE 1994 IEEE 6th International Confer

[IEEE 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Santa Barbara, CA, USA (27-31 March 1994)] Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Long wavelength metal-semiconductor-metal photodetectors with Ti/Au and indium-tin-oxide electrodes

✍ Adesida, I.; Seo, J.W.; Wohlmuth, W.; Caneau, C.; Bhat, R. 📂 Article 📅 1994 🏛 IEEE ⚖ 355 KB

[IEEE 2010 17th IEEE International Sympo

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability and breakdown characteristics of HfO2-based GaAs metal-oxide-semiconductor capacitors with a thin Si interface layer

✍ Das, T.; Mahata, C.; Dalapati, G.K; Chi, D.; Sutradhar, G.; Bose, P.K.; Maiti, C 📂 Article 📅 2010 🏛 IEEE ⚖ 361 KB