✦ LIBER ✦

A comparative analysis of switched-current circuits

✍ Scribed by Nairn, D.G.; Biman, A.

Book ID: 115455574
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 971 KB
Volume: 43
Category: Article
ISSN: 1057-7130
DOI: 10.1109/82.544026

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Noise Analysis of Switched-Current Circu

Noise Analysis of Switched-Current Circuits

✍ Ivan H. H. Jørgensen; Gudmundur Bogason 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 164 KB

A Current-to-Frequency Converter for Swi

A Current-to-Frequency Converter for Switched-Current Circuits

✍ Yukihiro Kuroda; Akira Hyogo; Keitaro Sekine 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 75 KB

Design and Analysis of Built-In Testers

Design and Analysis of Built-In Testers for CMOS Switched-Current Circuits

✍ Cheng-Ping Wang; Chin-Long Wey 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 193 KB

Wave variable analysis of passive switch

Wave variable analysis of passive switched-capacitor circuits

✍ Davis, A. 📂 Article 📅 1985 🏛 IEEE ⚖ 275 KB

Synthesizing switched-current filters by

Synthesizing switched-current filters by transposing the SFG of switched-capacitor filter circuits

✍ Roberts, G.W.; Sedra, A.S. 📂 Article 📅 1991 🏛 IEEE ⚖ 343 KB

Built-in self test of S2I switched curre

Built-in self test of S2I switched current circuits

✍ Geir E. Sether; Chris Toumazou; Gaynor Taylor; Kevin Eckersall; Ian M. Bell 📂 Article 📅 1996 🏛 Springer 🌐 English ⚖ 475 KB

This article presents a new concept for built-in self test of switched current circuits based on $2I memory cells. From the spectrum of possible transistor defects reported in CMOS processes [2], five different faultsituations were modelled and the ability to detect the various failures was studied