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A Compact Model for Polysilicon TFTs Leakage Current Including the Poole–Frenkel Effect

✍ Scribed by Wu, W.J.; Yao, R.H.; Li, S.H.; Hu, Y.F.; Deng, W.L.; Zheng, X.R.


Book ID
114618953
Publisher
IEEE
Year
2007
Tongue
English
Weight
606 KB
Volume
54
Category
Article
ISSN
0018-9383

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