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A new I-V model considering the impact-ionization effect initiated by the DIGBL current for the intrinsic n-channel poly-Si TFTs

✍ Scribed by Hsin-Li Chen; Ching-Yuan Wu


Book ID
114537676
Publisher
IEEE
Year
1999
Tongue
English
Weight
217 KB
Volume
46
Category
Article
ISSN
0018-9383

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