A combined use of SIMS and RBS techniques for the investigation of SiC and SiCN films
β Scribed by F. Caccavale; G. Brusatin; I. Kleps
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 283 KB
- Volume
- 81
- Category
- Article
- ISSN
- 0169-4332
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The background of several electrochemical techniques -recording of the corrosion potential E corr , electrochemical impedance spectroscopy (EIS), electrochemical noise analysis (ENA) and recording of potentiodynamic polarization curves -has been discussed and examples of the use of these techniques
The techniques of X-ray and neutron reflectometry are compared with respect to their application for the investigation of polymeric thin films. While the use of X-ray reflectometry is limited due to the small contrast between most polymers, deuteration offers many possibilities for neutron reflectom