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A closed-loop evaluation and validation of a method for determining the dependence of the electron mobility on the longitudinal-electric field in MOSFETs

โœ Scribed by Roldan, J.B.; Gamiz, F.; Lopez-Villanueva, J.A.


Book ID
114536943
Publisher
IEEE
Year
1997
Tongue
English
Weight
187 KB
Volume
44
Category
Article
ISSN
0018-9383

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