9.4L: Late-News Paper: Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs

✍ Scribed by Yong-Sung Kim; Ho-Hyun Nahm; Dae Hwan Kim

• Book ID: 115558033
• Publisher: Wiley (John Wiley & Sons)
• Year: 2012
• Weight: 165 KB
• Volume: 43
• Category: Article
• ISSN: 0003-966X
• DOI: 10.1002/j.2168-0159.2012.tb05719.x