𝔖 Bobbio Scriptorium

✦ LIBER ✦

7423. X-ray reflectivity study of SiO2 on Si: S M Heald et al, J Vac Sci Technol, A8, 1990, 2046–2048

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 205 KB
Volume: 42
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(91)91230-l

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