✦ LIBER ✦
7425. X-ray photoelectron spectroscopy/Ar+ ion profile study of thin oxide layers on InP: S M Thurgate and N E Erickson, J Vac Sci Technol, A8, 1990, 3669–3675
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 64 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0042-207X
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