𝔖 Bobbio Scriptorium

✦ LIBER ✦

719. Microminaturization bibliography: Electron. Reliability & Micromin., 2 (1), Jan./March 1963, 71–76

Book ID: 103444103
Publisher: Elsevier Science
Year: 1963
Tongue: English
Weight: 91 KB
Volume: 13
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(63)90928-x

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720. Circuit design and parameters in th

720. Circuit design and parameters in thin film technology: F. F. Jennym, Electron. Reliability & Micromin., 2 (1), Jan./ March 1963, 19–26

📂 Article 📅 1963 🏛 Elsevier Science 🌐 English ⚖ 91 KB