✦ LIBER ✦
720. Circuit design and parameters in thin film technology: F. F. Jennym, Electron. Reliability & Micromin., 2 (1), Jan./ March 1963, 19–26
- Publisher
- Elsevier Science
- Year
- 1963
- Tongue
- English
- Weight
- 91 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0042-207X
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