4918385 Method and process for testing the reliability of integrated circuit (IC) chipsand novel IC circuitry for accomplishing same

✍ Scribed by RobertW Shreeve

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 192 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90254-5