4855672 Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same

✍ Scribed by RobertW Shreeve

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 177 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90679-h