## Abstract This paper discusses the test‐generation circuit which automatically generates a test pattern for a combinational circuit. The test‐generation circuit is designed so that two algorithms of automatic test generation and fault simulation can be executed by the circuit. The test pattern fo
✦ LIBER ✦
4716564 Method for test generation
✍ Scribed by AngeloCJ Hung; FrancisC Wang
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 87 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0026-2714
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