✦ LIBER ✦

4706018 Noncontact dynamic tester for integrated circuits

✍ Scribed by Johannes Beha; Russell W Dreyfus; Gary W Rubloff

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 190 KB
Volume: 28
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(88)90409-x

No coin nor oath required. For personal study only.

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