4481628 Apparatus for testing dynamic noise immunity of digital integrated circuits

✍ Scribed by Rossan Pasquinelli; SestoS Giovanni

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 156 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90641-9