✦ LIBER ✦

4587480 Delay testing method for CMOS LSI and VLSI integrated circuits

✍ Scribed by John Zasio

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A silicon based technology for monolithi

✍ U. Hilleringmann; K. Knospe; C. Heite; K. Schumacher; K. Goser 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 227 KB

4947105 Method and circuit for testing i

✍ Bernhard Unger; Rainer Rauschert 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 86 KB

4601034 Method and apparatus for testing

✍ Thirumalai Sridhar 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 92 KB

4488354 Method for simulating and testin

✍ KasunK Chan; GeraldJ Erickson; DavidB Schuck; JamesW Stone 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 67 KB

4972413 Method and apparatus for high sp

✍ HughW Littlebury; Mavin Swapp 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 86 KB

4881029 Semiconductor integrated circuit

✍ Masahiko Kawamura 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 87 KB