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4520448 Method of characterizing reliability in bipolar semiconductor devices

โœ Scribed by Bernard Tremintin

Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
163 KB
Volume
26
Category
Article
ISSN
0026-2714

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## Abstract In power stations and substations of electric power companies, power semiconductor devices such as diodes and thyristors have been used in control power supplies and emergency power supplies since the 1970s. Such equipment is designed on the assumption that power semiconductor devices a