𝔖 Bobbio Scriptorium
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4500993 In-circuit digital tester for testing microprocessor boards

✍ Scribed by Robert Jacobson


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
84 KB
Volume
25
Category
Article
ISSN
0026-2714

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Boundary scan is a method of implementing test access to the terminals of a component, cluster, or board. Although substituting boundary scan access for direct tester access to these terminals does not alter the concept of digital testing, the replacement of parallel test vectors by serial data stre