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3D-Orientation Microscopy in a FIB SEM: A New Dimension of Microstructure Characterization

✍ Scribed by Zaefferer, S; Wright, S; Raabe, D

Book ID: 118161484
Publisher: Cambridge University Press
Year: 2007
Tongue: English
Weight: 325 KB
Volume: 13
Category: Article
ISSN: 1431-9276
DOI: 10.1017/s1431927607077343

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