3D Imaging and Analysis : with Surface Metrology Software

✍ Scribed by François Blateyron; Antony Caulcutt

• Publisher: Wiley (John Wiley & Sons)
• Year: 2006
• Weight: 343 KB
• Volume: 8
• Category: Article
• ISSN: 1439-4243
• DOI: 10.1002/imic.200790094

✦ Synopsis

The ability to manipulate materials on smaller and smaller scales has led to an increasing demand for surface metrology solutions that facilitate innovation and help to assure quality. While 2D (x, z) surface characterisation is still very common in industry today, in many cases 3D (x, y, z) characterisation is required in order to evaluate the properties and the quality of a surface. It is very likely that 3D characterisation will become the industrial standard within a decade.