𝔖 Bobbio Scriptorium

✦ LIBER ✦

376. Investigation of properties of doped semiconductors by the method of ion-backscattering: A Fiderkevich and A Golanski, Proc Int Work Conf on Ion Implant in Semicon, Rossendorf 1972, 101–104 (in Russian).

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 158 KB
Volume: 24
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(74)91890-9

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