✦ LIBER ✦

2496. An auger analysis of the SiO2-Si interface

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 147 KB
Volume: 27
Category: Article
ISSN: 0042-207X
DOI: 10.1016/s0042-207x(77)80845-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

New studies of the Si-SiO2 interface usi

New studies of the Si-SiO2 interface using auger sputter profiling

✍ C.R. Helms; W.E. Spicer; N.M. Johnson 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 344 KB

The peculiarities of Si/SiO2 interfaces

The peculiarities of Si/SiO2 interfaces in the Si–SiO2 systems with Si nanocrystals

✍ T. Kryshtab; G. Gómez Gasga; N. Korsunska; M. Baran; S. Kirillova; L. Khomenkova 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 281 KB

Si-rich-SiO 2 layers with excess silicon of 45-50% were grown by RF magnetron co-sputtering from pure SiO 2 and Si targets and were studied by Raman scattering, HRTEM, electron-paramagnetic resonance and X-ray diffraction (XRD) methods as well as by photo-voltage technique operated at different temp

Analysis on interface states of ultrathi

Analysis on interface states of ultrathin-SiO2/Si(111)

✍ Ryu Hasunuma; Atsushi Ando; Kazushi Miki; Yasushiro Nishioka 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 176 KB

Application of Auger Depth Profiling on

Application of Auger Depth Profiling on the AlSiO2 Interface

✍ Jung, T. ;Titel, W. 📂 Article 📅 1982 🏛 John Wiley and Sons 🌐 English ⚖ 381 KB

An experimental determination of the car

An experimental determination of the carrier lifetime near the SiSiO2 interface

✍ P.C.T. Roberts; J.D.E. Beynon 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 523 KB

Ellipsometric study of Si surface roughn

Ellipsometric study of Si surface roughness and the SiSiO2 interface

✍ A Aizenberg; AV Andrianov; SV Nosenko; VI Pshenicin; IA Hromcovski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB