Er-doped amorphous SiO x thin films with different oxygen contents (0pxp2) were prepared by co-evaporation of Si and SiO 2 . The evolution of the structure of the annealed films was followed by infrared absorption spectrometry. With annealing treatment, a phase separation process occurs, leading to
✦ LIBER ✦
1.54 μm luminescence of Er-doped SiOx and GeOx thin films: A comparative study
✍ Scribed by H. Rinnert; G. Wora Adeola; M. Ardyanian; P. Miska; M. Vergnat
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 511 KB
- Volume
- 146
- Category
- Article
- ISSN
- 0921-5107
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