✦ LIBER ✦
A method of measuring thicknesses and doping profiles of homoepitaxial thin (from 0.1 μm on) films of silicon and gallium arsenide: M. Jagusztyn. Electron Technology. Warsaw7, (34), 81 (1974)
- Publisher
- Elsevier Science
- Year
- 1976
- Tongue
- English
- Weight
- 252 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0026-2714
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