Zn, Mn and Te K-edge EXAFS studies of the diluted magnetic semiconductor
β Scribed by Happo, N; Sato, H; Mihara, T; Mimura, K; Hosokawa, S; Ueda, Y; Taniguchi, M
- Book ID
- 127203655
- Publisher
- Institute of Physics
- Year
- 1996
- Tongue
- English
- Weight
- 146 KB
- Volume
- 8
- Category
- Article
- ISSN
- 0953-8984
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Nickel-Based Diluted Magnetic Semiconductor (Zn, Ni)Te K. Ando (a), A. K. Bhattacharjee 1 ) (b), H. Tanoue (a), T. Takamasu (c), Y. Imanaka (c), G. Kido (c), T. Yasuhira (d), Y. H. Matsuda (d), and N. Miura (d)
The diluted magnetic semiconductor, Zn 0.568 Mn 0.432 Te, is studied by means of neutron diffraction and cold neutron scattering below 100 K. Distribution of magnetic diffuse scattering intensity indicates the coexistence of two kinds of antiferromagnetic short-range orders, i.e. type-III and type-I