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Zeeman laser-scanning confocal microscopy in turbid media

✍ Scribed by Peng, Lee-Cheng; Chou, Chien; Lyu, Chung-Wei; Hsieh, Jen-Chuen

Book ID
115424568
Publisher
Optical Society of America
Year
2001
Tongue
English
Weight
110 KB
Volume
26
Category
Article
ISSN
0146-9592

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A new nondestructive technique, confocal scanning laser microscopy (CSLM), is described that is used to characterize the topography and morphology of polymer coatings. The topography of the coating can be determined even when the coating is completely opaque. When the coating is not completely opaqu