✦ LIBER ✦
Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires
✍ Scribed by Yang, B.; Motz, C.; Rester, M.; Dehm, G.
- Book ID
- 119996733
- Publisher
- Taylor and Francis Group
- Year
- 2012
- Tongue
- English
- Weight
- 627 KB
- Volume
- 92
- Category
- Article
- ISSN
- 1478-6435
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