Yield optimization of integrated circuits : Yanagawa, T.IEEE Trans. Electron. Dev., Vol E-20, No 1 (January 1973) pp 19–28

• Book ID: 103044956
• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 146 KB
• Volume: 5
• Category: Article
• ISSN: 0010-4485
• DOI: 10.1016/0010-4485(73)90296-0