Y2O3 stabilized ZrO2 thin films deposited by electron beam evaporation: Structural, morphological characterization and laser induced damage threshold

✍ Scribed by Shi Gang Wu; Hong Ying Zhang; Guang Lei Tian; Zhi Lin Xia; Jian Da Shao; Zheng Xiu Fan

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 803 KB
• Volume: 253
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2006.02.044