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XUV optics characterization at the National Institute of Standards and Technology

✍ Scribed by R.N. Watts; C. Tarrio; T.B. Lucatorto; R.P. Madden; R.D. Deslattes; A. Caticha; W.T. Estler; C.J. Evans; T. McWaid; J. Fu; T.V. Vorburger

Book ID: 113283965
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 336 KB
Volume: 79
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(93)95335-3

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