XTEM Studies of Nickel Silicide Growth on Si(100) Using a Ni/Ti Bilayer System

✍ Scribed by Falke, U. ;Fenske, F. ;Schulze, S. ;Hietschold, M.

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 351 KB
• Volume: 162
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(199708)162:2<615::aid-pssa615>3.0.co;2-q