XRF determination of 17 trace elements in geological samples using an extended Compton scattering correction procedure

✍ Scribed by Feng Liangyuan; Bao Huilan; Li Ruoling; Zhang Yawen

• Book ID: 112906395
• Publisher: SP Science Press
• Year: 1990
• Tongue: English
• Weight: 432 KB
• Volume: 9
• Category: Article
• ISSN: 1000-9426
• DOI: 10.1007/bf02837950