𝔖 Bobbio Scriptorium
✦   LIBER   ✦

XPS—Investigation of contamination layers

✍ Scribed by K. Persy; N. Gurker

Book ID
103736794
Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
754 KB
Volume
13
Category
Article
ISSN
0368-2048

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

XPS investigation of surface oxidation l
XPS investigation of surface oxidation layers on a platinum electrode in alkaline solution
✍ M. Peuckert 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 651 KB

thick oxidation layer on a platinum electrode has been grown in 1 N NaOH at 3 V us Ag/AgCI reference electrode. After transferring the Pt electrode into an ultrahigh vacuum chamber the surface layer was analysed by X-ray photoelectron spectroscopy. Pt4f,,,, Pt4f,,, and 01s electron binding energies

Significantly different contamination of
Significantly different contamination of atomically clean Si(001) when investigated by XPS and AES
✍ Nicoleta G. Gheorghe; George A. Lungu; Ruxandra M. Costescu; Cristian M. Teodore 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 669 KB

## Abstract Clean Si(001) single crystal surfaces provided different surface reconstructions: __p__(1 × 2) and __c__(__n__ × 2) (__n__ = 4, 6) at room temperature. The __in situ__ oxidation of these surfaces was followed by Auger electron spectroscopy and by X‐ray photoelectron spectroscopy. It is