In this work we have applied the X-ray photoelectron spectroscopy (XPS) in depth to study, for the first time, the influence of different thermal treatments in the ITO-Si interface of a monocrystalline Si-based solar cell where the Si surface is carbonate-textured and covered by an ITO sputtered lay
XPS surface analysis of monocrystalline silicon solar cells for manufacturing control
✍ Scribed by M.J. Ariza; F. Martín; D. Leinen
- Publisher
- Springer
- Year
- 2001
- Tongue
- English
- Weight
- 407 KB
- Volume
- 73
- Category
- Article
- ISSN
- 1432-0630
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