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XPS study on the dispersion of carbon additives in silicon carbide powders

โœ Scribed by S. Contarini; S.P. Howlett; C. Rizzo; B.A. De Angelis


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
416 KB
Volume
51
Category
Article
ISSN
0169-4332

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Silicon carbide (Sic) was chemical vapor deposited (CVD) onto a carbon fiber to investigate oxidation protection of the coating. This thin film of Sic was analyzed before and after argon and oxygen ion beam etching with core and valence band X-ray Photoelectron Spectroscopy (XPS). The valence band o