XPS Study of the Bonding Properties of Lanthanum Oxide/Silicon Interface with a Trace Amount of Nitrogen Incorporation

✍ Scribed by Wong, H.; Iwai, H.; Kakushima, K.; Yang, B. L.; Chu, P. K.

• Book ID: 115494488
• Publisher: The Electrochemical Society
• Year: 2010
• Tongue: English
• Weight: 217 KB
• Volume: 157
• Category: Article
• ISSN: 0013-4651
• DOI: 10.1149/1.3268128