New method to correct for the influence
โ
Vereecke, G.; Rouxhet, P. G.
๐
Article
๐
1999
๐
John Wiley and Sons
๐
English
โ 150 KB
๐ 2 views
A new method is proposed to correct for attenuation effects by adventitious organic contamination in quantitative XPS. The corrected intensity ratio I o X =I o Y involving two different substrate peaks is determined as the slope of the plot of I X =I C1s as a function of I Y =I C1s for samples cover