XPS nondestructive depth analysis method and its application in cement based composite materials

✍ Scribed by Hu Shuguang

• Book ID: 102999559
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 378 KB
• Volume: 24
• Category: Article
• ISSN: 0008-8846
• DOI: 10.1016/0008-8846(94)90165-1

✦ Synopsis

This paper introduces the principle and testing method of X-ray photoelectron spectroscopy (XPS) angle variation technique which is a nondestructive surface depth analysis method and compares it with the mechanical stripping method and the ion etching method. Thereby, the depth analysis of the composite interfacial layer between polyacrylamide and monoealcium aluminate in MDF cement has been carried out. The chemical reaction mechanism and the structural properties have also been discussed in light of the experimental results.