Effect of ion energy on structural and e
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Ram, Sanjay K. ;Kroely, Laurent ;Bulkin, Pavel ;Cabarrocas, Pere Roca i
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Article
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2010
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John Wiley and Sons
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English
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## Abstract Microcrystalline silicon films were deposited in a matrix distributed electron cyclotron resonance (MDECR) plasma enhanced chemical vapor deposition (PECVD) system using pure silane, under varying substrate bias conditions. Microstructural characterization of the films shows a lower voi