XPS characterization of nitrogen-doped c
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Morant, C. ;Andrey, J. ;Prieto, P. ;Mendiola, D. ;Sanz, J. M. ;Elizalde, E.
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Article
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2006
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John Wiley and Sons
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English
β 410 KB
## Abstract In this work, CNTs have been bombarded with low energy N ions. Xβray photoelectron spectroscopy have been used to determine the binding configuration of the Nβdoped CNTs. AFM was also used to determine their morphology and mechanical properties. The same morphology is maintained after t