XPS Characterization of the Corrosion Fi
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Splinter, S. J.; Rofagha, R.; McIntyre, N. S.; Erb, U.
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Article
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1996
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John Wiley and Sons
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English
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X-ray photoelectron spectroscopy (XPS) was used to examine the corrosion films formed on nanocrystalline (nc) and amorphous Ni-P alloys in 0.1 M H,SO,. Neither the nc nor the amorphous alloys were found to exhibit passivity. An enrichment of elemental P compared to Ni was observed at the surface of