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XPS and AES sputter-depth profiling at surfaces of biocompatible passivated Ti-based alloys: concentration quantification considering chemical effects

✍ Scribed by Oswald, Steffen; Gostin, Petre-Flaviu; Helth, Arne; Abdi, Somayeh; Giebeler, Lars; Wendrock, Horst; Calin, Mariana; Eckert, Jürgen; Gebert, Annett


Book ID
127249587
Publisher
John Wiley and Sons
Year
2014
Tongue
English
Weight
274 KB
Volume
46
Category
Article
ISSN
0142-2421

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