XPS analysis with depth resolution of chemical bath-deposited ZnSe thin films

✍ Scribed by A. M. Chaparro; C. Maffiotte; J. Herrero; M. T. Gutiérrez

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 156 KB
• Volume: 30
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/1096-9918(200008)30:1<522::aid-sia746>3.0.co;2-9